DocumentCode :
683282
Title :
An improved optical simulation method for crystalline silicon solar cells
Author :
Guanchao Xu ; Yang Yang ; Kangping Zhang ; Wei Liu ; Shaoyong Fu ; Zhiqiang Feng ; Verlinden, Pierre
Author_Institution :
State Key Lab. of PV Sci. & Technol., Trina Solar, Changzhou, China
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2677
Lastpage :
2680
Abstract :
The combination of light reflectance, light trapping and absorption plays an important role in the conversion efficiency of solar cells. An accurate modeling of these parameters is paramount for optimizing solar cells through simulation. In the past, optical simulations have suffered from lack of accuracy. In particular, quality of texturization, non-specular reflection on the back surface and free carrier absorption (FCA) has been difficult to simulate. An improved optical simulation method is introduced in this paper. Based on the image of the textured front surface, obtained from scanning electron microscope (SEM), a three-dimensional model is automatically generated for Sentaurus TCAD simulator. The roughness of the rear side of the cell creates non-specular reflection of infra-red light, which is simulated by combining a three-dimensional pyramid structure and Phong´s model. Free carrier absorption is introduced after measurement of the doping profiles. A good fit between measured and simulated reflectivity data over a wide range of wavelengths is demonstrated, resulting in a reliable optical generation profile for the subsequent semiconductor device simulation.
Keywords :
scanning electron microscopy; semiconductor device models; solar cells; technology CAD (electronics); Phong model; TCAD simulator; back surface; crystalline silicon solar cells; doping profiles; free carrier absorption; light absorption; light reflectance; light trapping; optical generation profile; optical simulation method; optical simulations; scanning electron microscope; semiconductor device simulation; three-dimensional model; three-dimensional pyramid structure; Optical reflection; Optical surface waves; Photovoltaic cells; Reflectivity; Semiconductor device modeling; Semiconductor process modeling; Surface morphology; Phong´s model; free carrier absorption; light trapping; optical simulation; texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6745024
Filename :
6745024
Link To Document :
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