Title : 
The shunt influence of Al-p+ emitter on Voc characteristics and its optimization for Interdigitated Back Contact solar cells
         
        
            Author : 
Wei Zhang ; Chen Chen ; Rui Jia ; Janssen, G.J.M. ; Dai-Sheng Zhang ; Zhao Xing ; Bronsveld, Paula C. P. ; Weeber, Arthur W. ; Zhi Jin ; Xin-yu Liu
         
        
            Author_Institution : 
Inst. of Microelectron., Beijing, China
         
        
        
        
        
        
            Abstract : 
In the case of screen-printed aluminum alloyed p+ emitter (Al-p+) Interdigitated Back Contact (IBC) solar cells, the shunt path induced by non-uniformity and discontinuity of the Al-p+ emitter has been minimized by exact control of firing condition. PC2D simulation results show that reduction and elimination of shunt path on Al-p+ emitter can significantly enhance the photovoltaic properties especially the open-circuit voltage (Voc). We use a multi-diode model to establish the relation between the Voc and the effective shunt resistance of the cell.
         
        
            Keywords : 
aluminium alloys; solar cells; PC2D simulation; Voc characteristics; firing condition; interdigitated back contact solar cells; multi-diode model; open-circuit voltage; photovoltaic properties; screen-printed aluminum alloyed p+ emitter; shunt path reduction; shunt resistance; Firing; Optimization; Photovoltaic cells; Photovoltaic systems; Resistance; Silicon; Al-p+ emitter; IBC; photovoltaic cells; silicon; simulation;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
         
        
            Conference_Location : 
Tampa, FL
         
        
        
            DOI : 
10.1109/PVSC.2013.6745025