DocumentCode :
683349
Title :
Investigation of pilling strength and bus bar surface roughness for solar cell soldering
Author :
Wen-Tai Chung ; Yi-Te Wu ; Chien-Wen Chen ; Po-Wen Wang ; Meng-Lin Lin ; Tsai-Yuan Lin ; Chih-Hsyong Wu
Author_Institution :
Motech Ind., Inc., Tainan, Taiwan
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
2992
Lastpage :
2993
Abstract :
In the present, the soldering is the major method to connect the silicon crystalline solar cell and module in the industry. Cu-ribbon is the main interconnector to string solar cells and conducts the electricity from solar cells to the solar cell module. The pilling strength between solar cells and Cu-ribbons is an important factor to soldering process reliability and efficiency. The paper reveals the pilling strength is relative to the surface roughness of the bus bar on the silicon solar cell. Rougher surface on the bus bar has the stronger pilling strength in this study.
Keywords :
busbars; elemental semiconductors; silicon; solar cells; soldering; surface roughness; bus bar surface roughness; copper ribbon; pilling strength; silicon crystalline solar cell; solar cell module; solar cell soldering; soldering process reliability; surface roughness; Fingers; Photovoltaic cells; Rough surfaces; Silicon; Soldering; Surface roughness; Surface treatment; Bus bar; Pilling strength; Ribbon; Silicon; Solar cell;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6745091
Filename :
6745091
Link To Document :
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