DocumentCode
683354
Title
Accelerated life testing of PV arc-fault detectors
Author
Johnson, Jamie ; Neilsen, Michael ; Vianco, Paul ; Sorensen, N. Robert ; Montoya, M. ; Fresquez, Armando
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
3014
Lastpage
3019
Abstract
As of 2011, the National Electrical Code® (NEC) has required arc-fault circuit interrupters (AFCIs) to be incorporated into photovoltaic (PV) systems to prevent fires. Some manufacturers are designing AFCIs to consist of arc-fault detectors (AFD) incorporated into inverters or combiner boxes in order to take advantage of the DC switching functionality of the existing hardware. Since AFCIs and AFDs are safety devices, it is critical to ensure the long-term functionality of AFD devices in these harsh environments. Sandia National Laboratories (SNL) has performed accelerated life tests on 10 arc-fault detectors. The devices were tested after being subjected to the thermal damage equivalent of 1.7-year increments in an inverter until 77.6 equivalent years of solder fatigue damage. 30% of the boards experienced component failures but there were no solder failures, indicating solder fatigue is not the primary failure mode. Based on these results, Sandia recommends an appropriate burn-in process be used for production of arc-fault prevention devices.
Keywords
arcs (electric); fault diagnosis; invertors; life testing; photovoltaic power systems; AFCI; AFD devices; NEC; National Electrical Code; SNL; Sandia National Laboratories; accelerated life testing; arc-fault circuit interrupters; arc-fault detectors; arc-fault prevention devices; burn-in process; combiner boxes; dc switching functionality; inverters; long-term functionality; solder fatigue; Acceleration; Detectors; Fatigue; Inverters; Laboratories; Life estimation; Soldering; accelerated life testing; arc-fault detectors; photovoltaic systems; rainflow counting; thermomechanical solder fatigue;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6745096
Filename
6745096
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