Title :
Role of high series resistance in admittance spectroscopy of kesterite solar cells
Author :
Weiss, Thomas P. ; Redinger, Alex ; Luckas, J. ; Mousel, Marina ; Siebentritt, Susanne
Author_Institution :
Lab. for Photovoltaics, Univ. of Luxembourg, Belvaux, Luxembourg
Abstract :
Cu2ZnSn(S, Se)4 (CZTSSe) solar cells suffer from parasitic resistance effects when decreasing the temperature. This effect can cause distortions in the admittance spectrum. We perform temperature dependent current-voltage (IVT) and admittance measurements on six different CZTSe devices with efficiencies between 4 % and 6 %. From IVT measurements we deduce a thermally activated series resistance. This activation energy agrees with an activation energy obtained from admittance measurements. The activation energy of the series resistance is identified with one of the capacitance steps in the C-f profile. The origin of the series resistance remains unclear, even though hints for a barrier are present.
Keywords :
copper compounds; distortion; electric admittance measurement; solar cells; spectroscopy; sulphur compounds; thermal resistance; tin compounds; zinc compounds; C-f profile; Cu2ZnSn(SSe)4; IVT measurements; activation energy; admittance measurements; admittance spectroscopy; admittance spectrum; efficiency 4 percent to 6 percent; high series resistance; kesterite solar cells; parasitic resistance effects; temperature dependent current-voltage measurements; thermally activated series resistance; Admittance; Capacitance; Electrical resistance measurement; Photovoltaic cells; Resistance; Temperature dependence; Temperature measurement; CZTSe; IVT; admittance; deep defects; kesterite; series resistance;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6745108
