Title :
Lifetime testing of metallized thin film capacitors for inverter applications
Author :
Flicker, Jack ; Kaplar, Robert ; Marinella, Matthew ; Granata, Jennifer
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
In order to understand the degradation mechanisms and failure precursors of metallized thin film capacitors (MTFC) used in photovoltaic (PV) inverters, we have carried out accelerated testing on MTFCs. By understanding the degradation mechanisms and precursors of imminent catastrophic failure, implementation of a prognostics and health management (PHM) plan can be used to optimize PV array operations and maintenance (O&M), decreasing cost per watt towards the US Department of Energy goals.
Keywords :
invertors; life testing; solar cells; thin film capacitors; PV array operations; US Department of Energy goals; accelerated testing; degradation mechanisms; failure precursors; imminent catastrophic failure; lifetime testing; metallized thin film capacitors; photovoltaic inverters; prognostics and health management plan; Capacitance; Capacitors; Degradation; Heating; Inverters; Life estimation; Testing; PV systems; capacitors; inverter reliability;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6745166
