• DocumentCode
    68352
  • Title

    The Role of Surface Condition in the Yields of Secondary Electrons, Backscattered Electrons, and Photoelectrons From Spacecraft

  • Author

    Lai, Shu T.

  • Author_Institution
    Dept. of Aeronaut. & Astronaut., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    41
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    3492
  • Lastpage
    3497
  • Abstract
    This paper reviews some active research topics of outgoing electron currents in spacecraft charging. The spacecraft potential is determined by the current balance. On a spacecraft, the incoming currents of ambient electrons and ambient ions can be measured, whereas the outgoing currents of secondary electrons (SEs), backscattered electrons (BEs), and photoelectrons (PEs) cannot. The outgoing currents depend on the incoming currents, surface materials, and surface conditions. For SE yields, using the encyclopedia parameters of the materials is not sufficient; surface conditions also need to be taken into account. For BEs, the yield approaches unity as the primary electron energy approaches zero. For PEs, reflectance is important. We conjecture that highly reflective surfaces generate little or no PEs and would charge to negative voltages as if in eclipse. As a consequence, differential charging may develop between adjacent surfaces as they get exposed to sunlight.
  • Keywords
    electric current measurement; electron backscattering; spacecraft charging; BE; PE; SE; ambient electron current measurement; ambient ion current measurement; backscattered electron; outgoing electron current; photoelectron; primary electron energy approach; secondary electron; spacecraft charging; surface material condition; Aircraft manufacture; Materials; Rough surfaces; Space vehicles; Surface charging; Surface contamination; Surface roughness; Backscattered electrons (BEs); photoelectrons (PEs); secondary electrons (SEs); spacecraft charging; surface conditions;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2282372
  • Filename
    6648457