• DocumentCode
    683619
  • Title

    Direct eutectic AuSn solder bumping on Al bond pad surface using laser solder ball jetting

  • Author

    Mian Zhi Ding ; Jie Li Aw ; Li Shiah Lim ; Leong Ching Wai ; Rao, V. Srinivasa

  • Author_Institution
    Inst. of Microelectron., ASTAR (Agency for Sci. Technol. & Res.), Singapore, Singapore
  • fYear
    2013
  • fDate
    11-13 Dec. 2013
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    Au-rich eutectic AuSn (Au80wt%-Sn20wt%) solder ball alloy is extensively used in MEMS and optoelectronics packaging, for providing flip-chip solder bump interconnections. In this paper, we will look into the possibility of using laser solder ball jetting process for direct eutectic AuSn solder bumping on Al bond pad surface, and compare with eutectic AuSn solder bumping on Al bond pad with Ti/Ni/Au UBM structure. The laser jetted eutectic AuSn solder bumps were observed to wet and form hemi-spherical bumps on the Al bond pad surface, with and without UBM structure. FIB-EDX analysis of the laser jetted eutectic AuSn solder bump on Al bond pad with UBM structure showed formation of dense islands of Au5Sn IMC layer from the top Au finishing layer of the UBM structure. On the other hand, only a few clusters of Au5Sn IMC were formed near to the solder joint of the laser jetted eutectic AuSn solder bump on Al bond pad surface. Ball shear test on the laser jetted eutectic AuSn solder bumps exhibited average solder shear strength of 4.52g/mil2 and 14.22g/mil2, on Al bond pad surface and Al bond pad with UBM structure respectively. Laser jetted eutectic AuSn solder bumps on Al bond pad surface displayed pad lift failure mode, as compared to failure at Al bond pad layer for Al bond pad with UBM structure. In conclusion, eutectic AuSn solder balls could be bumped onto Al bond pad surface via laser jetting.
  • Keywords
    aluminium; electronics packaging; eutectic alloys; flip-chip devices; gold alloys; metallurgy; optoelectronic devices; preforms; solders; tin alloys; Al; AuSn; FIB EDX analysis; MEMS packaging; TiNiAu; ball shear test; bond pad surface; direct eutectic solder bumping; flip chip solder bump interconnections; laser jetted eutectic solder bumps; laser solder ball jetting; optoelectronics packaging; pad lift failure mode; solder ball alloy; solder joint; solder shear strength; Conferences; Decision support systems; Electronics packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-2832-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2013.6745717
  • Filename
    6745717