Title :
X-parameter techniques for signal integrity in high-speed links
Author :
Schutt-Aine, Jose ; Comberiate, Tom
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Abstract :
X-parameters have been shown to have a wide array of applications in the modeling of nonlinear devices and systems. In this work we demonstrate that they can be combined with LIM and IBIS to produce robust models for high-speed links. In particular IBIS data generation from X parameters is demonstrated and its advantage over currently available methods is discussed.
Keywords :
mixed analogue-digital integrated circuits; signal processing; IBIS data generation; LIM; X-parameter techniques; high-speed links; latency insertion method; nonlinear devices; nonlinear systems; signal integrity; Electronics packaging; Harmonic analysis; Integrated circuit modeling; Mathematical model; Ports (Computers); Semiconductor device modeling; Voltage measurement;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC 2013), 2013 IEEE 15th
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-2832-3
DOI :
10.1109/EPTC.2013.6745719
