DocumentCode
683849
Title
Enhancement of thermal conduction of polyimide/boron nitride nanocomposites
Author
Saysouk, F. ; Diaham, S. ; Locatelli, M.-L. ; Belkerk, B. ; Scudeller, Y. ; Salles, V. ; Chiarac, R. ; Toche, F.
Author_Institution
Lab. Plasma et Conversion d´Energie, Univ. de Toulouse, Toulouse, France
fYear
2013
fDate
20-23 Oct. 2013
Firstpage
543
Lastpage
546
Abstract
Two kinds of polyimide-boron nitride (PI-BN) nanocomposite have been manufactured by the direct blending process using two different kinds and sizes of BN nanoparticles, referred as BN-1 and BN-2. A high power ultrasonic probe has been used to achieve the dispersion of BN nanoparticles within the polyimide precursor solution. Thermal conductivity has been evaluated for filler volume content up to 29.1% vol. for PI-BN-1 and 57.3% vol. for PI-BN-2. Thermal conductivity has been measured using a pulsed photo-thermal technique developed for determining the thermal properties of solid thin-films and coatings. The use of BN nanoparticles allows thermal conductivity to be increased but the observed increase depends strongly on the nanoparticle diameter. Thermal conductivity increases from 0.21 W/mK for the neat polyimide (PI) to 0.56 W/mK for the PI-BN-1 (29.1% vol.) However, when using lower size BN nanoparticles the thermal conductivity only increases up to 0.25 W/mK for the PI-BN-2 for higher volume content (57.3% vol.).
Keywords
blending; boron compounds; disperse systems; heat conduction; nanocomposites; nitrogen compounds; thermal conductivity; thin film devices; BN nanoparticle dispersion; direct blending process; high power ultrasonic probe; polyimide precursor solution; polyimide-boron nitride nanocomposites; pulsed photothermal technique; solid coatings; solid thin-films; thermal conduction enhancement; thermal conductivity; Conductivity; Films; Gold; Nanocomposites; Nanoparticles; Temperature measurement; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CEIDP.2013.6747082
Filename
6747082
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