• DocumentCode
    683863
  • Title

    Influence of interfacial condition between film and lower electrode on space charge measurement

  • Author

    Murakami, Yasutaka ; Sugiyama, Takatoshi ; Funo, Ruji ; Fukuma, Masumi ; Nagao, Masaru

  • Author_Institution
    Toyohashi Univ. of Technol., Toyohashi, Japan
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    1062
  • Lastpage
    1065
  • Abstract
    One electrical insulation evaluation technology is the pulsed electroacoustic method, which detects the acoustic pressure due to the space charge in the bulk. To improve its reliability, a measurement system for the apparent acoustic impedance of the sample is introduced into the space charge measurement system. The apparent acoustic impedance of a polyethylene terephthalate film increases as the applied mechanical pressure increases. The position of the lower electrode signal shifts under a lower mechanical pressure and magnitude of the lower electrode signal decreases. The larger silicone oil layer lead to a charge shift due to interfacial polarization and a smaller magnitude of the pressure wave generated from the interface between the silicone oil layer and the sample.
  • Keywords
    acoustic impedance; charge measurement; electrochemical electrodes; insulation; power apparatus; pulsed electroacoustic methods; space charge; acoustic pressure detection; apparent acoustic impedance; electrical insulation evaluation technology; interfacial condition; interfacial polarization; lower electrode; mechanical pressure; polyethylene terephthalate film; polymeric insulating materials; power apparatuses; power transmission cost reduction; pressure wave generation; pulsed electroacoustic method; reliability improvement; silicone oil layer; space charge measurement system; Acoustic measurements; Acoustics; Charge measurement; Electrodes; Impedance; Positron emission tomography; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CEIDP.2013.6747102
  • Filename
    6747102