DocumentCode :
683867
Title :
Study of montmorillonite concentration on dielectric property and dispersion of cross-linked polyethylene/montmorillonite nano-composites
Author :
Wei Zhang ; Man Xu ; Xiang Zhang ; Darong Xie
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear :
2013
fDate :
20-23 Oct. 2013
Firstpage :
531
Lastpage :
534
Abstract :
Polymer nanocomposites can get great improvement in dielectric property without apparent change in their own characters. In this paper, nano montmorillonite (MMT)/cross-linked Polyethylene (XLPE) composite samples were prepared by the melt blending method and then the effect of dispersion of MMT particles on the dielectric property were studied. X-ray diffraction (XRD) and scanning electron microscope (SEM) was used to analyze the dispersion of MMT particles in polymer resin. The results showed that MMT particles can be well dispersed and intercalated in XLPE. The results of TSC showed that the deep trap level and charge density increased as content of MMT increase. Dielectric property shows that the permittivity of XLPE/MMT nanocomposites was higher than that of pure XLPE and increase with MMT concentration. Dielectric loss peak occurred in the low-frequency area, indicating the interface polarization in MMT/XLPE composite. The breakdown field strength of composite materials increased with the MMT concentration. This could also be regarded as the interface effect existed between MMT and XLPE.
Keywords :
X-ray diffraction; blending; dielectric losses; electric breakdown; nanocomposites; permittivity; polymers; scanning electron microscopes; SEM; X-ray diffraction; XLPE composite samples; XRD; breakdown field strength; charge density; composite materials; cross-linked polyethylene; dielectric loss peak; eep trap level; melt blending method; montmorillonite concentration; montmorillonite nanocomposites; permittivity; polymer nanocomposites; polymer resin; scanning electron microscope; Dielectrics; Dispersion; Electric breakdown; Electron traps; Polyethylene; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
Type :
conf
DOI :
10.1109/CEIDP.2013.6747413
Filename :
6747413
Link To Document :
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