DocumentCode
683892
Title
Research of Dielectric spectroscopy on insulation ageing assessment of XLPE cables
Author
Ji Liu ; You Xu ; Xinlao Wei ; Xiujing Li
Author_Institution
State Key Lab. Breeding Base of Dielectr. Eng., Harbin Univ. of Sci. & Technol., Harbin, China
fYear
2013
fDate
20-23 Oct. 2013
Firstpage
140
Lastpage
143
Abstract
In this paper, the model cables are studied by means of frequency domain spectroscopy (FDS) which involves the measurement of capacitance, the real permittivity and dissipation factor as a function of frequency. Firstly, XLPE cable samples were carried out accelerated thermal ageing at 135 °C. Then, frequency domain spectroscopy was investigated under laboratory condition, including different degree of thermal ageing and different test temperatures. Mechanism was analyzed using the theory of dielectric relaxation in solids. From the data and curves, it can be shown that the capacitance and dissipation factor are increased with the ageing time, and dissipation factor is increased with the decreasing of frequency in specific frequency range. Moreover, capacitance and real part of permittivity were found to be more sensitive to temperature variation, thus temperature is a key factor which must be taken account when using FDS method for diagnosing cable insulation. The investigation of dielectric spectroscopy is effective and convenient for ageing assessment of XLPE cables.
Keywords
XLPE insulation; ageing; cable insulation; capacitance measurement; frequency-domain analysis; permittivity; spectroscopy; FDS; XLPE cables; accelerated thermal ageing; cable insulation diagnosis; capacitance measurement; dielectric relaxation theory; dielectric spectroscopy; dissipation factor; frequency domain spectroscopy; insulation ageing assessment; permittivity; Aging; Cable insulation; Dielectrics; Frequency measurement; Permittivity; Temperature measurement; Dielectric relaxation; FDS; Thermal ageing; XLPE cable;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CEIDP.2013.6747454
Filename
6747454
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