Title :
Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer
Author :
Awny, A. ; Moeller, L. ; Junio, Joseph ; Scheytt, J. Christoph ; Thiede, A.
Author_Institution :
Dept. of High-Freq. Electron., Univ. of Paderborn, Paderborn, Germany
Abstract :
A millimeter wave frequency mixed-signal design of a 1-tap half-rate look-ahead decision feedback equalizer for 80 Gb/s short-reach optical communication systems is presented. On-wafer tests are developed to determine the maximum operating bit rate of the equalizer. Results are also presented for intersymbol interference mitigation at 80 Gb/s for a 20 GHz bandwidth-limited channel. Further improvements on the architecture of the 80 Gb/s equalizer are discussed and used in the design and on-wafer measurement of a 110 Gb/s equalizer. The equalizers are designed in a 0.13 μm SiGe:C BiCMOS technology. The 80 and 110 Gb/s versions dissipate 4 and 5.75 W, respectively and occupy 2 and 2.56 mm2, respectively.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; bipolar MIMIC; carbon; decision feedback equalisers; intersymbol interference; mixed analogue-digital integrated circuits; optical communication; BiCMOS technology; SiGe:C; bandwidth 20 GHz; bit rate 110 Gbit/s; bit rate 80 Gbit/s; decision feedback equalizer; frequency mixed-signal design; half-rate look-ahead decision; intersymbol interference mitigation; measurement techniques; millimeter wave design; on-wafer measurement; on-wafer tests; power 4 W; power 5.75 W; short-reach optical communication; size 0.13 mum; Bit rate; Clocks; Decision feedback equalizers; Delays; Feedback loop; Decision feedback equalizers; MMICs; intersymbol interference; optical fiber dispersion; optical receivers;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2013.2285385
