Title :
The statistical analysis of factors influencing the pulsed breakdown of castor oil
Author :
Zhang, Haijun ; Zhang, Z.C. ; Yang, H.W. ; Shu, Ting
Author_Institution :
Coll. of Optoelectron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
The insulating properties of the dielectric play an important role in the performance of pulsed power modulators. In this paper, the microsecond pulse insulating properties of castor oil were studied with the ARC-01 modulator used as the pulse output source. The results were analyzed by the application of Weibull distribution model. Under quasi-uniform fields, the breakdown field of castor oil was about 73.5 kV/mm in the single pulse mode condition. Under non-uniform fields, castor oil showed higher breakdown field strength when the needle electrode was positive than that was negative. The mineral oil showed the contrast performance. Factors, which includes the effective electrode area, the hydrostatic pressure, and the pulse repetition rate, influencing the breakdown field were experimentally studied and discussed. The results show promising applications of castor oil in the pulse forming line.
Keywords :
Weibull distribution; electric breakdown; electrodes; insulating oils; minerals; modulators; needles; pulsed power technology; statistical analysis; ARC-01 modulator; Weibull distribution model; castor oil; dielectric insulating property; electrode area; hydrostatic pressure; microsecond pulse insulating property; mineral oil; needle electrode; nonuniform field; pulse forming line; pulse output source; pulse repetition rate; pulsed breakdown field strength; pulsed power modulator; quasiuniform field; single pulse mode condition; statistical analysis; Breakdown voltage; Dielectric liquids; Dielectrics; Electric breakdown; Electrodes; Insulation; Needles; Castor oil; Electrical breakdown; Weibull distribution; effective electrode area; hydrostatic pressure; pulse repetition rate;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CEIDP.2013.6748109
