DocumentCode :
684105
Title :
Measurement of pollution level of 66 kV transmission line insulators
Author :
Salam, M.A. ; Ang, S.P. ; Ong, Bun Theang ; Malik, Owais A. ; Voon, William ; Alinurrezan, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Inst. Technol. Brunei, Gadong, Brunei
fYear :
2013
fDate :
20-23 Oct. 2013
Firstpage :
1124
Lastpage :
1127
Abstract :
The presence of unwanted constituent on insulator surface of transmission tower plays an important ignition property for the likelihood of occurrence of flashover. In this paper, the pollution level of two aged insulators namely the longrod silicon rubber and the cap-and-pin glass insulators are measured. The results from the measurement shows that the Equivalent Salt Deposit Density (ESDD) of the cap-and-pin glass insulator, particularly near the pin is found to be 0.169 mg/cm2 while the composition over the cap surface is 0.136 mg/cm2. For the case of longrod silicon rubber insulator, the ESDD for both the pin and the cap are found to be 0.063 mg/cm2 and 0.016 mg/cm2 respectively. The outcomes from the ESDD measurements suggest that the cap-and-pin glass insulator string is severely contaminated with salt spray as compared to the longrod silicon rubber. Furthermore, a mathematical model of ESDD expressed in terms of salinity and temperature for both insulators is derived from multivariable regression method. The coefficients for both the cap-and-pin glass and longrod silicon rubber insulator are found to be 0.9984 and 0.9867 respectively.
Keywords :
insulator contamination; pollution measurement; power transmission lines; ESDD; aged insulators; cap-and-pin glass insulators; equivalent salt deposit density; longrod silicon rubber; pollution level measurement; salinity; transmission line insulators; voltage 66 kV; Conductivity; Glass; Pollution; Rubber; Silicon; Temperature measurement; ESDD; Salt-solution; cap-and-pin glass and silicon rubber insulators; regression analysis; salinity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
Type :
conf
DOI :
10.1109/CEIDP.2013.6748144
Filename :
6748144
Link To Document :
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