DocumentCode :
684117
Title :
Band width limits in wide band partial discharge calibration and corresponding countermeasures
Author :
Jianyin Liu ; Zhong Zheng ; Wei Feng ; Xiaoyun Chen ; Hong Yu ; Zhiwei Huang ; Rongliang Wang
Author_Institution :
State Key Lab. for Alternate Electr. Power Syst. with Renewable Energy Sources, North China Electr. Power Univ., Beijing, China
fYear :
2013
fDate :
20-23 Oct. 2013
Firstpage :
1278
Lastpage :
1281
Abstract :
Partial discharge (PD) measurement method defined in IEC60270 only captures the low frequency energy of measured signals, while more than 95% of the energy is distributed in the range of 30kHz~30MHz. Thus a high frequency wide band measurement method becomes fashionable to cover the entire bandwidth. In such frequency range, the influence of stray inductance and capacitance become dominant, especially in the conventional calibration process, where the calibration pulses are directly wired to the bushing through long single wires. In IEC bandwidth, this is not a problem since frequency is low. In high frequency, it makes the recorded calibration charge much smaller than the named quantity. Thus the calibration process becomes meaningless. This paper has studied such influence in a real 110kV transformer bushing through circuit analyses and real measurement. An innovative co-axial sensor is presented and shows good frequency response and measurement accuracy.
Keywords :
IEC standards; calibration; partial discharge measurement; power transformer insulation; IEC bandwidth; IEC60270; PD measurement method; bandwidth limits; circuit analyses; co-axial sensor; high frequency wide band measurement method; low frequency energy; partial discharge measurement method; stray capacitance; stray inductance; transformer bushing; voltage 110 kV; wide band partial discharge calibration; Bandwidth; Calibration; Couplings; Frequency measurement; Insulators; Partial discharges; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location :
Shenzhen
Type :
conf
DOI :
10.1109/CEIDP.2013.6748174
Filename :
6748174
Link To Document :
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