• DocumentCode
    684156
  • Title

    A research on the surface charge with different coating tip by Electrostatic Force Microscope

  • Author

    Zhi Sun ; Xuan Wang ; Wei Song ; Qingquan Lei

  • Author_Institution
    Key Lab. of Eng. Dielectr. & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    295
  • Lastpage
    297
  • Abstract
    Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.
  • Keywords
    charge injection; chromium; cobalt; electron emission; field emission; insulating coatings; iridium; platinum; surface charging; work function; Co; Cr; EFM; Ir; Pt; charge injection process; coating tip; electron emission electrode; electrostatic force microscope; field emission; hot electron emission; insulated films; micro-nanometer scale; polyimide film surface charge; work function; Coatings; Dielectrics; Electron emission; Films; Microscopy; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CEIDP.2013.6748244
  • Filename
    6748244