Title : 
The critical pulse width for surface flashover and bulk breakdown in oil-immersed polymers
         
        
            Author : 
Zhao, Lu ; Su, Joey C. ; Zhang, X.B. ; Pan, Y.F. ; Wang, L.M. ; Li, Ruodai ; Sun, Xinghua ; Zeng, Bing ; Cheng, James
         
        
            Author_Institution : 
Sci. & Technol. on High Power Microwave Lab., Northwest Inst. of Nucl. Technol., Xi´an, China
         
        
        
        
        
        
            Abstract : 
The general regularities of the electric surface flashover threshold (Ef) of polymers immersed in transformer oil and the polymers´ bulk breakdown threshold (EBD) versus pulse width (τ) are obtained respectively by summarizing the experimental data in literatures. Those regularities are that Ef is proportional to τ-1/4 and that EBD is proportional to τ-1/6 when τ is smaller than 30 ns, when τ is larger than 30 ns, EBD is independent on τ It is discovered that there exists a critical pulse width (τc) by comparing the regularities of EBD and Ef versus τ of the same dielectric thickness in one coordinate. If τ is greater than τc, Ef is lower than EBD, and the surface flashover may cause the insulation to fail. However if τ is smaller than τc, Ef would be larger than EBD, and the bulk breakdown would cause the insulation to fail. The existence of τc is experimentally verified via a specific example of dozens of polymer samples immersed in transformer oil. In addition, methods on how to design short-pulse long-life insulators are proposed in this paper based on the concept of τc.
         
        
            Keywords : 
electric breakdown; flashover; polymer insulators; transformer oil; EBD; bulk breakdown threshold; critical pulse width; dielectric thickness; electric surface flashover threshold; insulation; oil-immersed polymers; polymer samples; short-pulse long-life insulators; transformer oil; Dielectrics; Flashover; Insulators; Oil insulation; Plastics;
         
        
        
        
            Conference_Titel : 
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
         
        
            Conference_Location : 
Shenzhen
         
        
        
            DOI : 
10.1109/CEIDP.2013.6748321