DocumentCode :
684933
Title :
Comparison of mechanical properties of lead-free microscale solder joints under tensile and shear loading
Author :
Yin, L.M. ; Lin, J.X. ; Zhang, T.T. ; Yao, Z.X. ; Du, C.H. ; Tang, M.
Author_Institution :
Sch. of Metall. & Mater. Eng., Chongqing Univ. of Sci. & Technol., Chongqing, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
888
Lastpage :
891
Abstract :
In this study, adopting a dynamic mechanical analyzer (DMA Q800, TA-Instruments), the mechanical properties and fracture behaviors of “copper wire/Sn-3.0Ag-0.5Cu solder/copper wire” sandwich structured microscale solder joints with a constant diameter of 400 μm and a height of 125-325 μm were investigated under two different quasi-static loading modes (i.e., tensile loading and shear loading) at 100 °C. The experimental results show that the tensile and shear strength of all microscale Sn-3.0Ag-0.5Cu solder joints decreased with the increasing of joint height. Under same loading rate of 1N/min at 100°C, the shear strength and shear fracture strain of Sn-3.0Ag-0.5Cu solder joints are much lower than tensile strength and tensile fracture strain, this means the shear stress is more severe for solder joint interconnections in electronic packaging. In addition, the fracture position and fracture mechanism of microscale Sn-3.0Ag-0.5Cu solder joints are significantly different under different loading modes.
Keywords :
copper alloys; electronics packaging; fracture toughness; shear strength; silver alloys; solders; tensile strength; tin alloys; DMA Q800; Sn-Ag-Cu; TA-instruments; copper wire sandwich structured microscale solder joints; dynamic mechanical analyzer; electronic packaging; fracture behaviors; lead-free microscale solder joints; mechanical property; quasistatic loading modes; shear fracture strain; shear loading; shear strength; shear stress; size 400 mum; solder joint interconnections; temperature 100 degC; tensile fracture strain; tensile loading; tensile strength; Copper; Joints; Loading; Soldering; Strain; Stress; Wires; Lead-free; Mechanical property; Shear strength; Solder joints; Tensile strength;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756604
Filename :
6756604
Link To Document :
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