Title :
Optical and thermal properties of PI/TiO2@SiO2
Author :
Xu Xia ; Jinghua Yin ; Xing Zhao ; Rong Jin
Author_Institution :
Sch. of Appl. Sci., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
The optical and thermal properties of polyimide (PI) composite films are very important parameters in the application of electrical insulation materials. The reports show that the ultraviolet (UV) and heat from aging conditions always destroy the PI. In this background, a novel method using SiO2-coated TiO2 (TiO2@SiO2) as dopant has been proposed and the composite films with 15% content of SiO2@TiO2 are prepared. Surface morphology and element distribution, phase structure, optical and thermal properties of the films are tested and characterized by scanning electron microscope (SEM), X-ray diffraction instrument (XRD), UV-Vis spectrophotometer (UV-Vis) and thermal gravity analysis (TGA),respectively. The results show that inorganic nano-particles are well dispersed into PI, the content of SiO2 in TiO2@SiO2 is about 12%, TiO2@SiO2 in PI/TiO2@SiO2 is about 15%. The light-radiation resistant properties of PI/TiO2@SiO2 is similar to pure PI, and are much better than PI/TiO2. TiO2@SiO2 absorbs most of the UV in PI/TiO2@SiO2, and SiO2 layer with broad band gap prevent released electron and hole from effecting the stability of PI. The decomposition temperature of the films will not be affected by nano-particles, but the weightlessness rate (residual quality fraction) of the films are affected obviously under the same heat-radiation conditions, the sequence of excellent thermal performance is PI/TiO2@SiO2>PI/TiO2>PI. The structure, optical property and thermal property of the materials are closely related to each other. To some extent, the structure of TiO2@SiO2 improves the optical performance and thermal performance of PI.
Keywords :
X-ray diffraction; ageing; decomposition; energy gap; filled polymers; heat radiation; nanocomposites; nanofabrication; nanoparticles; particle reinforced composites; scanning electron microscopy; silicon compounds; surface morphology; thermal analysis; thin films; titanium compounds; ultraviolet spectra; visible spectra; SEM; TGA; TiO2-SiO2; UV-vis spectrophotometry; UV-vis spectroscopy; X-ray diffraction; XRD; aging; band gap; coating; composite films; decomposition; dispersion; dopant; electrical insulation materials; element distribution; heat radiation; inorganic nanoparticles; light-radiation resistant properties; optical properties; phase structure; polyimide; residual quality fraction; scanning electron microscopy; stability; structural properties; surface morphology; thermal gravity analysis; thermal properties; weightlessness rate; Adaptive optics; Crystals; Diamonds; Optical diffraction; Optical films; Thermal analysis; PI matrix; TiO2@SiO2; composite film; optical property; polyimide; thermal property;
Conference_Titel :
Measurement, Information and Control (ICMIC), 2013 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-1390-9
DOI :
10.1109/MIC.2013.6758044