Title :
An Area-Efficient Clamp Based on Transmission Gate Feedback Technology for Power Rail Electrostatic Discharge Protection
Author :
Xiaowu Cai ; Beiping Yan ; Xiao Huo
Author_Institution :
Hong Kong Appl. Sci. & Technol. Inst., Hong Kong, China
Abstract :
An area-efficient clamp based on transmission gate feedback technology is presented for power rail electrostatic discharge (ESD) protection. With this novel design, only a time constant of 10 ns is required for triggering and keeping the clamp turn-on during an ESD event. Full chip ESD protection with this design can endure a human body model pulse of 4500 V. Compared with the conventional clamp with the same area, the proposed clamp has 28% improvement in ESD protection capability. Simulation results show that there is no mistriggering problem caused by power-on pulse and power noise.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit design; ESD protection capability; area-efficient clamp; clamp turn-on; full chip ESD protection; human body model pulse; mistriggering problem; power noise; power rail electrostatic discharge protection; power-on pulse; time 10 ns; transmission gate feedback technology; voltage 4500 V; CMOS integrated circuits; Clamps; Electrostatic discharges; Logic gates; Noise; Rails; Threshold voltage; Electrostatic Discharge; Electrostatic discharge; RC time constant; TLP testing; area-efficient clamp; transmission gate;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2015.2434835
