DocumentCode
68530
Title
Polycrystalline Silicon Nanowires Synthesis Compatible With CMOS Technology for Integrated Gas Sensing Applications
Author
Rogel, Regis ; Jacques, Emmanuel ; Pichon, Lionel ; Salaun, Anne Claire
Author_Institution
Inst. d´Electron. et de Telecommun. de Rennes, Univ. de Rennes 1, Rennes, France
Volume
61
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
598
Lastpage
604
Abstract
Polysilicon nanowires are synthesized following a classical top-down approach using conventional UV lithography technique fully compatible with the existing silicon complementary metal-oxide-semiconductor technology. N- and P-type in situ doping of these nanowires is controlled over a large range of doping levels and the electrical properties of these nanowires are analyzed. The results show that resistivity dependence with the doping level is both related to the nanowire size-dependent structural quality and doping specie. Charged gas species (ammonia) sensitivity of these nanowires has also been studied. In addition, the feasibility of N- and P-channel polysilicon nanowire transistors is demonstrated.
Keywords
CMOS integrated circuits; gas sensors; nanosensors; nanowires; semiconductor doping; ultraviolet lithography; CMOS technology; Si; UV lithography technique; ammonia sensitivity; charged gas; complementary metal oxide semiconductor technology; doping level; in situ doping; integrated gas sensing applications; nanowire size dependent structural quality; polycrystalline silicon nanowires synthesis; Conductivity; Doping; Nanowires; Resistance; Resistors; Silicon; Transistors; In situ doping; LPCVD; nanowires; polysilicon; thin-film transistor (TFT);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2295511
Filename
6717063
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