• DocumentCode
    68530
  • Title

    Polycrystalline Silicon Nanowires Synthesis Compatible With CMOS Technology for Integrated Gas Sensing Applications

  • Author

    Rogel, Regis ; Jacques, Emmanuel ; Pichon, Lionel ; Salaun, Anne Claire

  • Author_Institution
    Inst. d´Electron. et de Telecommun. de Rennes, Univ. de Rennes 1, Rennes, France
  • Volume
    61
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    598
  • Lastpage
    604
  • Abstract
    Polysilicon nanowires are synthesized following a classical top-down approach using conventional UV lithography technique fully compatible with the existing silicon complementary metal-oxide-semiconductor technology. N- and P-type in situ doping of these nanowires is controlled over a large range of doping levels and the electrical properties of these nanowires are analyzed. The results show that resistivity dependence with the doping level is both related to the nanowire size-dependent structural quality and doping specie. Charged gas species (ammonia) sensitivity of these nanowires has also been studied. In addition, the feasibility of N- and P-channel polysilicon nanowire transistors is demonstrated.
  • Keywords
    CMOS integrated circuits; gas sensors; nanosensors; nanowires; semiconductor doping; ultraviolet lithography; CMOS technology; Si; UV lithography technique; ammonia sensitivity; charged gas; complementary metal oxide semiconductor technology; doping level; in situ doping; integrated gas sensing applications; nanowire size dependent structural quality; polycrystalline silicon nanowires synthesis; Conductivity; Doping; Nanowires; Resistance; Resistors; Silicon; Transistors; In situ doping; LPCVD; nanowires; polysilicon; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2295511
  • Filename
    6717063