DocumentCode :
68530
Title :
Polycrystalline Silicon Nanowires Synthesis Compatible With CMOS Technology for Integrated Gas Sensing Applications
Author :
Rogel, Regis ; Jacques, Emmanuel ; Pichon, Lionel ; Salaun, Anne Claire
Author_Institution :
Inst. d´Electron. et de Telecommun. de Rennes, Univ. de Rennes 1, Rennes, France
Volume :
61
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
598
Lastpage :
604
Abstract :
Polysilicon nanowires are synthesized following a classical top-down approach using conventional UV lithography technique fully compatible with the existing silicon complementary metal-oxide-semiconductor technology. N- and P-type in situ doping of these nanowires is controlled over a large range of doping levels and the electrical properties of these nanowires are analyzed. The results show that resistivity dependence with the doping level is both related to the nanowire size-dependent structural quality and doping specie. Charged gas species (ammonia) sensitivity of these nanowires has also been studied. In addition, the feasibility of N- and P-channel polysilicon nanowire transistors is demonstrated.
Keywords :
CMOS integrated circuits; gas sensors; nanosensors; nanowires; semiconductor doping; ultraviolet lithography; CMOS technology; Si; UV lithography technique; ammonia sensitivity; charged gas; complementary metal oxide semiconductor technology; doping level; in situ doping; integrated gas sensing applications; nanowire size dependent structural quality; polycrystalline silicon nanowires synthesis; Conductivity; Doping; Nanowires; Resistance; Resistors; Silicon; Transistors; In situ doping; LPCVD; nanowires; polysilicon; thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2295511
Filename :
6717063
Link To Document :
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