Title : 
A novel 4H-SiC VDMOS utilizing fully depleted p-body structure
         
        
            Author : 
Yunbin Gao ; YouRun Zhang ; Haoran Wu ; Bo Zhang Ying Liu
         
        
            Author_Institution : 
State key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Dongguan, China
         
        
        
        
        
        
        
            Abstract : 
A novel n-channel VDMOS fabricated on 4H-SiC is reported. This device is a distinct double-layer structure with an ultra-thin n-doped region under a fully depleted p-body region in the channel region which induces a larger amount of carriers when the gate bias exceeds the threshold voltage, with little leakage current in off-state. As a result, the specific on-resistance of the VDMOS is 6.21 mΩ·cm2, which is obviously reduced comparing with a conventional structure as good as the blocking voltage of nearly 1000V.
         
        
            Keywords : 
MOSFET; leakage currents; silicon compounds; wide band gap semiconductors; 4H-SiC VDMOS; SiC; double-layer structure; fully depleted p-body structure; n-channel VDMOS; threshold voltage; ultra-thin n-doped region; Doping; Electric breakdown; Leakage currents; Logic gates; Scattering; Silicon carbide;
         
        
        
        
            Conference_Titel : 
Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
         
        
            Conference_Location : 
Chengdu
         
        
            Print_ISBN : 
978-1-4799-3050-0
         
        
        
            DOI : 
10.1109/ICCCAS.2013.6765245