DocumentCode :
685518
Title :
On Detecting Concurrency Defects Automatically at the Design Level
Author :
Padberg, Frank ; Carril, Luis M. ; Denninger, Oliver ; Blersch, Martin
Author_Institution :
Karlsruhe Inst. of Technol. KIT, Karlsruhe, Germany
Volume :
1
fYear :
2013
fDate :
2-5 Dec. 2013
Firstpage :
263
Lastpage :
271
Abstract :
We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.
Keywords :
concurrency control; formal specification; formal verification; software fault tolerance; communication behavior; concurrency defect patterns; concurrency defects detection; formal parallel specification; model checking; sequence diagram; software design diagrams; software specification; Concurrent computing; Detectors; Generators; Instruction sets; Semantics; Unified modeling language; Automated Defect Detection; Concurrency Defect Modeling; Parallel Specification Inference; Specification Mining;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Conference (APSEC), 2013 20th Asia-Pacific
Conference_Location :
Bangkok
ISSN :
1530-1362
Print_ISBN :
978-1-4799-2143-0
Type :
conf
DOI :
10.1109/APSEC.2013.44
Filename :
6805415
Link To Document :
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