• DocumentCode
    685518
  • Title

    On Detecting Concurrency Defects Automatically at the Design Level

  • Author

    Padberg, Frank ; Carril, Luis M. ; Denninger, Oliver ; Blersch, Martin

  • Author_Institution
    Karlsruhe Inst. of Technol. KIT, Karlsruhe, Germany
  • Volume
    1
  • fYear
    2013
  • fDate
    2-5 Dec. 2013
  • Firstpage
    263
  • Lastpage
    271
  • Abstract
    We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.
  • Keywords
    concurrency control; formal specification; formal verification; software fault tolerance; communication behavior; concurrency defect patterns; concurrency defects detection; formal parallel specification; model checking; sequence diagram; software design diagrams; software specification; Concurrent computing; Detectors; Generators; Instruction sets; Semantics; Unified modeling language; Automated Defect Detection; Concurrency Defect Modeling; Parallel Specification Inference; Specification Mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference (APSEC), 2013 20th Asia-Pacific
  • Conference_Location
    Bangkok
  • ISSN
    1530-1362
  • Print_ISBN
    978-1-4799-2143-0
  • Type

    conf

  • DOI
    10.1109/APSEC.2013.44
  • Filename
    6805415