Title :
Shipboard Solid-State Protection: Overview and Applications
Author :
Schmerda, Rich ; Cuzner, Robert ; Clark, Robin ; Nowak, Damian ; Bunzel, Steve
Author_Institution :
DRS-PCT, Milwaukee, WI, USA
Abstract :
This article presents an overview of the present art of low-voltage (LV) dc power distribution system protection using solid-state protective devices (SSPDs). It describes how IGBTand IGCT-based SSPDs are constructed and how the important feature of galvanic isolation can be included in them. The article outlines the advantages of SSPDs, which include reduced fault-current level, greatly reduced current interruption time, limitation of arc-flash energy, improved acoustic performance, and reduced maintenance. It also demonstrates protective coordination using three of these solid-state circuit breakers and discusses new paradigms to consider. Test results are presented validating the use of restraint signals to aid in proper protective coordination in a generic three-level power distribution system. The article also shows test results for two paralleled SSPD building blocks used to make higher-current-rated solid-state circuit breakers, showing very good dynamic current sharing.
Keywords :
DC machines; DC motor protection; insulated gate bipolar transistors; marine power systems; power bipolar transistors; power distribution protection; power field effect transistors; power semiconductor switches; ships; silicon compounds; thyristors; variable speed drives; IGBT; IGCT; SiC; dc power distribution system; dynamic current sharing; fault protection; galvanic isolation; insulated-gate bipolar transistor; integrated gate-commutated thyristor; medium-voltage direct current systems; ship power supply; shipboard electrical systems; silicon-carbide power semiconductor devices; solid state protective devices; variable frequency drives; zonal electrical distribution system; DC generators; Low voltage; Marine vehicles; Power consumption; Power distribution; Voltage measurement;
Journal_Title :
Electrification Magazine, IEEE
DOI :
10.1109/MELE.2013.2273395