• DocumentCode
    686689
  • Title

    Comparison between different methods for parametric image estimation in analyzer-based phase contrast images

  • Author

    Caudevilla, Oriol ; Majidi, Keivan ; Brankov, J.G.

  • Author_Institution
    Dept. of Electr. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Analyzer-based phase contrast imaging (ABI) is an emerging imaging technique capable of visualizing complex interactions between X-rays and an object. Like many of the modern imaging techniques, ABI is a computed imaging method where parametric images are estimated from raw data. ABI raw data is acquired by measuring (sampling) the angular intensity profile (AIP) of the X-ray beam passed through the object at different positions of the analyzer crystal. ABI can simultaneously generate a number of planar parametric images containing information about absorption, refraction, and scattering properties of the object. In this manuscript, we compare several parametric image estimation methods with a newly proposed method based on the maximum likelihood estimation. In addition, we evaluate the impact of angular sampling positions on parametric image estimation accuracy as measured by bias and variance.
  • Keywords
    X-ray absorption; X-ray scattering; diagnostic radiography; image sampling; maximum likelihood estimation; medical image processing; ABI; absorption properties; analyzer-based phase contrast images; angular intensity profile sampling; angular sampling positions; complex X-ray-object interactions; maximum likelihood estimation; parametric image estimation; refraction properties; scattering properties; Absorption; Maximum likelihood estimation; Position measurement; Radiography; X-rays; Analyzer-Based Imaging; Diffraction-Enhanced Imaging; Gradient Methods; Multiple-Image Radiography; Phase Sensitive Imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829118
  • Filename
    6829118