Title :
Comparison between different methods for parametric image estimation in analyzer-based phase contrast images
Author :
Caudevilla, Oriol ; Majidi, Keivan ; Brankov, J.G.
Author_Institution :
Dept. of Electr. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
Analyzer-based phase contrast imaging (ABI) is an emerging imaging technique capable of visualizing complex interactions between X-rays and an object. Like many of the modern imaging techniques, ABI is a computed imaging method where parametric images are estimated from raw data. ABI raw data is acquired by measuring (sampling) the angular intensity profile (AIP) of the X-ray beam passed through the object at different positions of the analyzer crystal. ABI can simultaneously generate a number of planar parametric images containing information about absorption, refraction, and scattering properties of the object. In this manuscript, we compare several parametric image estimation methods with a newly proposed method based on the maximum likelihood estimation. In addition, we evaluate the impact of angular sampling positions on parametric image estimation accuracy as measured by bias and variance.
Keywords :
X-ray absorption; X-ray scattering; diagnostic radiography; image sampling; maximum likelihood estimation; medical image processing; ABI; absorption properties; analyzer-based phase contrast images; angular intensity profile sampling; angular sampling positions; complex X-ray-object interactions; maximum likelihood estimation; parametric image estimation; refraction properties; scattering properties; Absorption; Maximum likelihood estimation; Position measurement; Radiography; X-rays; Analyzer-Based Imaging; Diffraction-Enhanced Imaging; Gradient Methods; Multiple-Image Radiography; Phase Sensitive Imaging;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829118