• DocumentCode
    686720
  • Title

    A new design of neuro-PET improving sensitivity

  • Author

    HanBack Shin ; Yong Choi ; Yoonsuk Huh ; Jin Ho Jung

  • Author_Institution
    Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The improvement of sensitivity in neuro-PET is crucial because it can reduce the scan time and/or the radiation dose. In this study, we proposed a novel PET detector design that combined conical shape detector with cylindrical one (conical PET) to obtain high sensitivity. The sensitivity as a function of the oblique angle and the ratio of the conical to cylindrical portion was estimated to optimize the design of conical PET using Monte Carlo simulation tool, GATE v6.2. An axial sensitivity and misplacement rate by penetration of γ rays were also estimated to evaluate the performance of the conical PET. The sensitivity was improved by 36% at the center of axial FOV. This value was similar to the analytically calculated value. The misplacement rate of conical PET was about 5% higher than the conventional PET. The results of this study demonstrated the conical detector proposed in this study could provide subsequent improvement in sensitivity which could allow to design high sensitivity PET for brain imaging.
  • Keywords
    Monte Carlo methods; brain; image reconstruction; medical image processing; neurophysiology; positron emission tomography; sensitivity; γ ray penetration; GATE v6.2; Monte Carlo simulation tool; analytically calculated value; axial sensitivity; brain imaging; conical PET; conical shape detector; conical-cylindrical portion; misplacement rate; neuro-PET; novel PET detector design; radiation dose; scan time; Detectors; Head; Imaging phantoms; Monte Carlo methods; Positron emission tomography; Sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829149
  • Filename
    6829149