• DocumentCode
    686731
  • Title

    Numerical investigation of a non-interferometric grating-based X-ray imaging system

  • Author

    Zhiqiang Chen ; Ran Zhang ; Li Zhang

  • Author_Institution
    Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Grating-based X-ray imaging can be classified into two categories: interferometric and non-interferometric. Interferometric setup, i.e. Talbot-Lau interferometer, has been intensively investigated in the recent past. To increase the angular sensitivity and maintain a reasonable system length, gratings with very small period are preferred, while the fabrication of such gratings remains challenging. Another obstacle for the interferometric setup is the degradation of visibility when using broadband X-ray sources, especially when operated at high Talbot orders. Non-interferometric setup uses a geometrical projection relation, thus has a more flexible system geometry. In this paper, we investigate the impact of several factors including grating period, intergrating distance and X-ray spectrum on the performance of the system using wave-optical simulations. In particular, we focus on the visibility of the phase stepping curve. Based on the simulation results, we discuss the design aspects and limitations of the non-interferometric setup.
  • Keywords
    X-ray apparatus; X-ray imaging; diffraction gratings; light interferometry; Talbot orders; X-ray spectrum; broadband X-ray sources; flexible system geometry; geometrical projection relation; grating period; interferometric setup; intergrating distance; noninterferometric grating-based X-ray imaging system; visibility degradation; wave-optical simulation; Absorption; Computational modeling; Electron tubes; Gratings; Imaging; Sensitivity; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829160
  • Filename
    6829160