Title :
A TOF PET detector development using waveform sampling and strip-line based data acquisition
Author :
Heejong Kim ; Chin-Tu Chen ; Chen, Hua-Tsung ; Ronzhin, Anatoly ; Ramberg, Erik ; Los, Sergey ; Murat, Pak ; Majewski, S. ; Chien-Min Kao
Author_Institution :
Dept. of Radiol., Univ. of Chicago, Chicago, IL, USA
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
We are developing a human-brain imaging TOF PET detector with high sensitivity and lower radioactive dose to patients. The proposed detector design consists of 36 detector modules, and each module has 4×8 LYSO scintillators coupled to SiPMs individually. For signal readout for detector modules, the transmission-line readout with high speed waveform sampling is adopted to fully exploit the fast time response of SiPM with reduced electronics channels. A detector simulation has been developed using Geant4 package to check the performances of the proposed detector. Previously we demonstrated that our signal readout approach is feasible with SiPM. Based on the experience with the proto-type readout board, second generation readout board has been developed to implement the transmission-line signal readout for the proposed detector. In the paper, we present the initial results obtained from the simulation studies and experimental tests using the newly developed strip-line board.
Keywords :
brain; data acquisition; dosimetry; medical image processing; photomultipliers; positron emission tomography; silicon radiation detectors; software packages; solid scintillation detectors; Geant4 package; LYSO scintillators; SiPM; TOF PET detector development; high-speed waveform sampling; human-brain imaging TOF PET detector; prototype readout board; radioactive dose; second generation readout board; strip-line based data acquisition; transmission-line readout; transmission-line signal readout; Detectors; Image reconstruction; Positron emission tomography; Spatial resolution; Strips; Time measurement; Transmission lines;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829212