Title :
K-edge imaging with a photon counting CT system
Author :
Matsumoto, Morio ; Kaibuki, Futoshi ; Ogawa, Koichi
Author_Institution :
Grad. Sch. of Eng., Hosei Univ., Tokyo, Japan
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
The purpose of our research is to measure the amount of contrast agents used in x-ray CT accurately. The use of contrast agents such as gold nano-particles enables molecular imaging with the x-ray CT system. To realize an energy discriminating measurement, we have developed a photon counting detector with a CdTe semiconductor that is able to measure x-rays with the count rate of 107 cps/mm2 with four energy windows. In order to measure the concentration ratio of the contrast agent, we used a k-edge imaging technique. The materials used in this experiment were Au-colloid, Pt-colloid and gadolinium solution. The results of experiments showed linearity between the linear attenuation coefficients of k-edge images that were calculated using the two energy bins near each k-edge, and the concentration ratios of the contrast agents. For Au-colloid, the measurement error was less than 4 %, while for the gadolinium agent, the accuracy depended on the window width. This was caused by the electrical noise in the lower energy window and the beam-hardening effect in the measured data.
Keywords :
II-VI semiconductors; cadmium compounds; colloids; computerised tomography; gadolinium; gold; measurement errors; nanoparticles; photon counting; platinum; wide band gap semiconductors; Au colloid; CdTe semiconductor; CdTe-Gd; CdTe-Pt; Pt colloid; X-ray computerised tomography; beam-hardening effect; contrast agent concentration ratio; electrical noise; energy discriminating measurement; energy windows; gadolinium solution; gold nanoparticles; k-edge imaging; linear attenuation coefficients; measurement error; molecular imaging; photon counting computerised tomography system; photon counting detector; window width; Attenuation; Detectors; Energy measurement; Image reconstruction; Materials; Photonics; Semiconductor device measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829299