DocumentCode
686908
Title
TV-based DOI De-blurring model for the dual-head flat-panel PET system
Author
Hung-Yi Chou ; Chien-Min Kao ; Chin-Tu Chen ; Cheng-Ying Chou
Author_Institution
Dept. of Bio-Ind. Mechatron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2013
fDate
Oct. 27 2013-Nov. 2 2013
Firstpage
1
Lastpage
4
Abstract
In the dual-head flat panel PET system (DHAPET), the unique detector arrangement leads to severe uncertainty of depth-of-interaction (DOI) and data truncation, which in turn result in poor image quality and data loss in the reconstructed images. To improve the distortions, we proposed a reconstruction strategy under the framework of the fast iterative shrinkage-thresholding algorithm (FISTA) for minimizing total variation and de-blurring the DOI effects. Through the FISTA, the time-consuming procedure of TV-constraint can be accelerated. Additionally, we incorporated the point spread function into the reconstruction procedure of the FISTA to account for the blurring effects of DOI. Our numerical results showed that the proposed method can not only achieve a fast convergence rate to facilitate its applications, but also compensate the DOI effect and artifacts to improve image quality.
Keywords
image enhancement; image restoration; iterative methods; medical image processing; optical transfer function; positron emission tomography; DHAPET; DOI effect; FISTA; TV-based DOI deblurring model; TV-constraint; data loss; data truncation; depth-of-interaction; distortion improvement; dual-head flat-panel PET system; fast convergence rate; fast iterative shrinkage-thresholding algorithm; image quality; image reconstruction; point spread function; reconstruction procedure; reconstruction strategy; severe uncertainty; time-consuming procedure; total variation minimization; unique detector arrangement; Detectors; Image reconstruction; Kernel; Minimization; Positron emission tomography; Spatial resolution; TV;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location
Seoul
Print_ISBN
978-1-4799-0533-1
Type
conf
DOI
10.1109/NSSMIC.2013.6829342
Filename
6829342
Link To Document