• DocumentCode
    687007
  • Title

    Fast cluster reconstruction in the NA62 Liquid Krypton electromagnetic calorimeter by using soft core embedded processors in FPGA

  • Author

    Badoni, D. ; Bizzarri, Mariano ; Bonaiuto, V. ; Checcucci, B. ; De Simone, N. ; Federici, L. ; Fucci, A. ; Paoluzzi, G. ; Papi, A. ; Piccini, M. ; Salamon, A. ; Salina, G. ; Santovetti, E. ; Sargeni, F. ; Venditti, S.

  • Author_Institution
    Dept. of Phys., Univ. of Rome “Tor Vergata”, Rome, Italy
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The NA62 experiment at CERN SPS aims to increase the precision in the measure of the Branching Ratio of the K+ → π+vv̅ decay. Efficient veto systems are needed to achieve the required background suppression level. The LKr, covering the angular range 1-10 mrad, is part of system vetoing photons due to π0 decay (from K+ → π + π0). This paper deals with the implementation of the LKr L0 trigger peak reconstruction algorithm on FPGA by using a mixed architecture based on soft core embedded processors together with custom VHDL modules. This solution allows an efficient and flexible reconstruction of the energy-deposition peak.
  • Keywords
    field programmable gate arrays; hardware description languages; kaon decay; nuclear electronics; particle calorimetry; semileptonic decays; trigger circuits; CERN SPS; FPGA; LKr L0 trigger peak reconstruction algorithm; NA62 experiment; NA62 liquid krypton electromagnetic calorimeter; VHDL modules; background suppression level; branching ratio; energy-deposition peak; fast cluster reconstruction; kaon+ decay into pion+pion0; kaon+ decay into pion++neutrino+antineutrino; pion0 decay; soft core embedded processors; Data acquisition; Detectors; Electromagnetics; Liquids; Mesons; Photonics; Program processors; Calorimetry; Electronic circuits; Trigger circuits; embedded processor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829445
  • Filename
    6829445