DocumentCode :
687038
Title :
Explorer-0: A Monolithic Pixel Sensor in a 180 nm CMOS process with an 18 µm thick high resistivity epitaxial layer
Author :
Kugathasan, T. ; Cavicchioli, C. ; Chalmet, P.L. ; Giubilato, P. ; Hillemanns, H. ; Junique, A. ; Mager, M. ; Marin Tobon, C.A. ; Martinengo, P. ; Mattiazzo, S. ; Mugnier, H. ; Musa, L. ; Pantano, D. ; Rousset, J. ; Reidt, F. ; Riedler, P. ; Snoeys, W. ;
Author_Institution :
CERN, Geneva, Switzerland
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
5
Abstract :
This work presents the design and characterization of Explorer-0, a Monolithic Active Pixel Sensor (MAPS) developed in the framework of the R&D activity for the upgrade of the Inner Tracking System (ITS) of the ALICE experiment at CERN. The Explorer-0 chip has been manufactured in the TowerJazz 180 nm CMOS Imaging Sensor process, based on a high-resistivity (p > 1 k Ω · cm), 18 μm thick, epitaxial layer. It contains different pixel designs with a variation of the collection electrode shape and pixel pitch (20 μm and 30 μm). The pixel circuit offers the possibility of varying the sensor bias and to decouple the read-out time from the charge integration time. Charge collection properties of the different pixel designs have been studied with respect to the sensor bias using a 5.9 keV X-ray source (55Fe) and a 4 GeV/c electron beam. The radiation tolerance of this technology in view of the expected radiation levels foreseen in ALICE has been established as well. The sensor capacitance, which is a key parameter for a compact low-power front-end design, has been estimated. Based on these results, a second version of the Explorer chip has been designed and successfully tested. The latter has a lower contribution of the circuit to the overall input capacitance allowing for a higher sensor Signal to Noise Ratio (SNR).
Keywords :
CMOS integrated circuits; nuclear electronics; readout electronics; semiconductor counters; ALICE experiment; CERN; CMOS process; Explorer-0 characterization; Explorer-0 chip; Explorer-0 design; Inner Tracking System; Monolithic Active Pixel Sensor; Signal-to-Noise Ratio; TowerJazz CMOS Imaging Sensor process; X-ray source; electron beam; high resistivity epitaxial layer; pixel designs; read-out time; size 18 mum; size 180 nm; CMOS integrated circuits; Capacitance; Electrodes; Epitaxial layers; Power demand; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829476
Filename :
6829476
Link To Document :
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