• DocumentCode
    687076
  • Title

    BESIII luminosity readout design based on embedded system

  • Author

    Zhao, Junhua ; Liu, Z.-A. ; Wang, Qijie ; Gong, Wenyu ; Lin, Huiming ; Guo, Fengrui ; Wang, Chingyue ; Liu, Zhe ; Deng, Feiqi ; Wang, Kangping

  • Author_Institution
    State Key Lab. of Particle Detection & Electron., Inst. of High Energy Phys.(IHEP), Beijing, China
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Zero-Degree Detector (ZDD) is a new Detector of Beijing Electron Spectrometer III (BESIII) for both double gamma event detection and luminosity monitoring to substitute the old luminosity monitor. A new luminosity readout is described in this paper which is designed in double width AMC/MTCA form factor with a large Xilinx Virtex5 FPGA in addition to normal electronic signal formation. A FPGA embedded PowerPC is used for data reading, accumulation and data transmission over a gigabit Ethernet. The setting of parameters like the discriminator threshold in Front End electronics is done via a special serial link under control of firmware in the same FPGA. This readout system has been put in operation since fall of 2012.
  • Keywords
    data communication; field programmable gate arrays; firmware; gamma-ray detection; local area networks; nuclear electronics; readout electronics; AMC-MTCA form factor; BESIII; BESIII luminosity readout design; Beijing Electron Spectrometer III; FPGA embedded PowerPC; Xilinx Virtex5 FPGA; ZDD; data accumulation; data reading; data transmission; double gamma event detection; electronic signal formation; firmware control; front end electronics; gigabit Ethernet; luminosity monitoring; serial link; zero-degree detector; Detectors; Embedded systems; Field programmable gate arrays; Logic gates; Monitoring; Random access memory; Synchronization; Luminosity readout; MTCA; ZDD; embedded system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829517
  • Filename
    6829517