DocumentCode :
687097
Title :
Time and energy measuring front-end electronics for long silicon strip detectors readout
Author :
Kleczek, R. ; Szczygiel, Robert ; Grybos, Pawel ; Otfinowski, P. ; Kasinski, Krzysztof
Author_Institution :
AGH Univ. of Sci. & Technol., Cracow, Poland
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
4
Abstract :
We report on the design of a self-triggered analog front-end readout electronics dedicated for signal detection from double-sided silicon microstrip sensors with capacitance at the order of tens pF (CDET ≈ 30 pF). The main requirements are: processing input pulses with the average rate of 150 kHz/channel, low power consumption and low noise at the same time. The single channel is built of two different parallel processing chains: the fast and slow. The fast path includes: a fast CR-RC shaper with the peaking time tp = 40 ns, a discriminator, a pulse stretcher and a time stamp latch. It is optimized to determine an input charge arrival time with resolution at the order of few ns. The slow path consists of: a slow shaper with the peaking time tp = 80 ns, a 5-bit flash ADC and a digital peak detector. This chain is dedicated for accurate energy measurement and it is optimized for low noise level. To protect against false noise-related hits coming from noisy fast processing path when the discrimination threshold is set low, the time-stamp validation circuit is used. Two prototype ASICs were implemented in UMC 180 nm CMOS technology: 8-channel AFE-XYTER and 128-channel STS-XYTER.
Keywords :
CMOS integrated circuits; nuclear electronics; readout electronics; silicon radiation detectors; 128- channel STS-XYTER; 8-channel AFE-XYTER; CMOS technology; digital peak detector; double-sided silicon microstrip sensors; input charge arrival time; long silicon strip detectors readout; peaking time; self-triggered analog front-end readout electronics; signal detection; time stamp latch; time-stamp validation circuit; Application specific integrated circuits; Detectors; Energy measurement; Shape measurement; Silicon; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829538
Filename :
6829538
Link To Document :
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