DocumentCode :
687123
Title :
Upgrade of the DEFEL proton beam line for detector response mapping
Author :
Castoldi, A. ; Guazzoni, C. ; Mezza, D. ; Montemurro, G.V. ; Carraresi, L. ; Taccetti, F.
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
5
Abstract :
We exploited the possibility of using a pulsed mono-energetic proton beam (DEFEL beam-line @ LABEC, Italy) able to provide bunches of protons with tunable energies for detector qualification, diagnostics and calibration. This allows qualification of the response of the detector-front end system over a wide range of calibrated charge levels, with high precision in space and time, reaching the highest ionization levels foreseen in the imaging detectors for the novel FEL X-ray facilities and in the monolithic detector arrays for the present and future nuclear physics experiments. In order to better fulfill the requests of detector characterization we upgraded the beam line performance in terms of spatial resolution of the proton beam with novel remotely controlled in-vacuum hi-resolution profiling slits and with a CMOS imager as 2D beam monitor. Up to now a beam spot down to about 40 μm has been achieved and potentially can be further improved. The time jitter of the proton bunches is better than 0.5 ns opening the way to probe also the transport dynamics of the charge carriers with accurate time resolution.
Keywords :
CMOS image sensors; X-ray detection; X-ray imaging; calibration; particle beam bunching; particle beam diagnostics; particle beam dynamics; proton beams; sensor arrays; timing jitter; 2D beam monitoring; CMOS imager; DEFEL proton beam line; FEL X-ray facilities; beam spot; charge carrier transport dynamics; charge level calibration; detector diagnostics; detector front end system response qualification; detector response mapping; imaging detector; ionization level; monolithic detector array; proton bunch; pulsed monoenergetic proton beam; remotely controlled in-vacuum hi-resolution profiling slits; spatial resolution; time jitter; tunable energy; CMOS integrated circuits; Detectors; Ionization; Particle beams; Protons; Silicon; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829568
Filename :
6829568
Link To Document :
بازگشت