• DocumentCode
    687138
  • Title

    Performance of FBK high-density SiPMs in scintillation spectrometry

  • Author

    Grodzicka, M. ; Szczesniak, T. ; Moszynski, M. ; Ferri, Alessandro ; Piemonte, C. ; Szawlowski, M. ; Gola, Alberto ; Tarolli, Alessandro

  • Author_Institution
    Nat. Centre for Nucl. Res., Swierk-Otwock, Poland
  • fYear
    2013
  • fDate
    Oct. 27 2013-Nov. 2 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The aim of this work is to provide the characteristics of Fondazione Bruno Kessler (FBK) high-density SiPMs with an active area of 2.2×2.2 mm2 (15×15 μm2 single cell size) in gamma-ray spectrometry with LSO and CsI:Tl scintillators. The measurements presented in this work covered: measurements of the single photoelectron spectra, characteristics of the breakdown voltage versus temperature, verification of the excess noise factor, selection of the optimum operating voltage for energy resolution, verification of the linearity of the SiPM response for both used scintillators, verification of the number of photoelectrons and gamma-ray spectrometry for a wide range of X and gamma ray energies from 22.1 to 1408 keV. The results of energy resolution obtained with the FBK SiPMs readout and two different scintillators were compared to those obtained for the same scintillator with the XP2020Q PMT.
  • Keywords
    caesium compounds; electric breakdown; gamma-ray spectrometers; lutetium compounds; photoelectron spectra; photomultipliers; solid scintillation detectors; thallium; CsI:Tl scintillators; FBK SiPM readout; Fondazione Bruno Kessler; LSO scintillators; Lu2SiO5-CsI:Tl-Si; breakdown voltage; electron volt energy 22.1 keV to 1408 keV; energy resolution; gamma-ray spectrometry; noise factor; scintillation spectrometry; single photoelectron spectra measurement; Crystals; Energy measurement; Energy resolution; Noise; Temperature; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-0533-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2013.6829583
  • Filename
    6829583