DocumentCode :
68718
Title :
64 x 48 TOF sensor in 0.35 spl mu/m CMOS with high ambient light immunity
Author :
Davidovic, M. ; Seiter, J. ; Hofbauer, Michael ; Gaberl, Wolfgang ; Schidl, Stefan ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
Volume :
50
Issue :
19
fYear :
2014
fDate :
September 11 2014
Firstpage :
1375
Lastpage :
1377
Abstract :
A multi-pixel 64 × 48 time-of-flight (TOF) range sensor whose speciality is high immunity against ambient light is presented. The chip was fabricated in a 0.35 μm 1P4M CMOS process, whereby a single pixel occupies an area of 45 × 60 μm2 achieving a fill factor of 50%. The measured distance shows a 1σ deviation below 3.7 mm in the optimum operating range for the sensor. The measurement results show that the sensor successfully acquires the distance even when some parts of the scenery are illuminated with 180 klx ambient light. Furthermore, the most accurate method to characterise particular pixels in a multi-pixel array is for the first time used in a multi-pixel TOF sensor.
Keywords :
CMOS image sensors; 1P4M CMOS process; fill factor; high ambient light immunity; high immunity against ambient light; multipixel 64×48 time-of-flight range sensor; multipixel TOF sensor; multipixel array; size 0.35 mum;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.2272
Filename :
6898655
Link To Document :
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