Beam calibration verification of the Beijing HI-13 Tandem accelerator based on the ESA SEU Monitor

Author

Luo Yin-Hong ; Guo Xiao-Qiang ; Guo Gang ; Fan Hui ; Hajdas, Wojtek

Author_Institution

Paul Scherrer Inst., Villigen, Switzerland

fYear

2013

fDate

Oct. 27 2013-Nov. 2 2013

Firstpage

1

Lastpage

5

Abstract

The new generation ESA SEU Monitor was used in Beijing HI-13 Tandem accelerator after initial cross-calibration with the proton beams at Paul Scherrer Institu. Heavy ion cross sections obtained at HI-13 were very consistent with those from HIF and RADEF facilities. Beam homogeneity was also verified based on the SEU physical bitmap. In addition, the cross section dependence on ion energy near direct ionization threshold was preliminarily analyzed. An effects of die orientation on heavy ion SEU rate was first discovered. The die design layout may be responsible for this phenomenon.

Keywords

SRAM chips; multichip modules; nuclear electronics; particle beam diagnostics; tandem accelerators; Beijing HI-13 Tandem accelerator; ESA SEU monitor; HIF facilities; Paul Scherrer Institu; RADEF facilities; SEU physical bitmap; SRAM multichip module AT68166F; beam calibration verification; heavy ion SEU rate; heavy ion cross sections; ion energy; ionization threshold; proton beams; Monitoring; Protons; Radiation effects; Random access memory; Single event upsets; Testing; SEU Monitor; SEU bitmap; charge sharing; die orientation; the design layout; the energy dependence;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE

Conference_Location

Seoul

Print_ISBN

978-1-4799-0533-1

Type

conf

DOI

10.1109/NSSMIC.2013.6829636

Filename

6829636