DocumentCode :
687198
Title :
Statistical energy determination in neutron detector systems for neutron scattering science
Author :
Kanaki, Kalliopi ; Hall-Wilton, Richard ; Andersen, Ken H. ; Anevski, Dragi ; Birch, John ; Xiao Xiao Cai ; Hoglund, Carina ; Hultman, L. ; Jansa Llamas, Isabel ; Keiderling, Uwe ; Khaplanov, Anton ; Kirstein, Oliver ; Schulz, Claudia ; Wilpert, Thomas
Author_Institution :
Sci. Directorate, Eur. Spallation Source ESS AB, Lund, Sweden
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
6
Abstract :
The energy determination of thermal and cold neutrons could revolutionize the field of neutron scattering science and transform the instrument design for future facilities. This contribution evaluates the feasibility and potential of a statistical determination of the neutron energy in the new generation of neutron detectors. In particular, the novel technology of multi-layer 10B thin film detectors present a unique opportunity of exploiting this possibility by using the various neutron penetration depths to extract energy information. A statistical mathematical model for doing so is being developed. To this end, measurements of absorption profiles on boron carbide have been performed at the Institutt for Energiteknikk, Norway and the Helmholtz Zentrum Berlin, Germany. The results of the data analysis allow for a preliminary estimate on the feasibility and the potential of this method.
Keywords :
data analysis; neutron detection; neutron sources; neutron-nucleus scattering; absorption profile; cold neutrons; data analysis; multiple layer 10B thin film detectors; neutron detector system; neutron energy; neutron penetration depths; neutron scattering science; statistical energy determination; statistical mathematical model; thermal neutrons; Detectors; Monitoring; B10; ESS; boron; boron carbide; energy measurement; neutron; neutron detectors; neutron scattering science;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829644
Filename :
6829644
Link To Document :
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