Title :
Whether the light yield amplification by laser could significantly improve the energy resolution of a scintillation detector?
Author :
Samedov, Victor V.
Author_Institution :
Nat. Res. Nucl. Univ. (Moscow Eng. Phys. Inst.), Moscow, Russia
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
In 2012, Wehe D.K. and coauthors proposed a method of light yield amplification in scintillation detectors. A trivalent activator ion RE3+ captures an electron produced by a particle in scintillator and becomes a divalent rare earth ion RE2+. The scintillator is illuminated by laser photons that excite RE2+ ions, which quickly de-excite and generate light photons. By cyclically excitation RE2+ ions, one can obtain many light photons during any chosen accumulation time. Authors suggested that this method could remove scintillation yield as a limiting factor of the energy resolution of scintillation detectors. This conclusion was based on rather simplified theoretical examination of the pulse formation process in an amplified scintillator. In this work, the theory of branching cascade processes was applied to description of the pulse formation process. The general formula for the energy resolution of an amplified scintillator was derived. From this formula, it follows that the scintillation yield is not a limiting factor of the energy resolution of amplified scintillation detectors. It was shown that the relative reduction in the energy resolution of an amplified scintillation detector with reference to an ordinary scintillation detector is less than a few percent.
Keywords :
amplification; rare earth metals; scintillation counters; accumulation time; amplified scintillation detector; branching cascade process; divalent rare earth ion; energy resolution; laser photons; light photon excitation; light photon generation; light yield amplification; pulse formation process; trivalent activator ion; Detectors; Energy resolution; Limiting; Materials; Noise; Photonics; X-rays;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829667