Title :
Precision measurement technique of photon detection efficiency of Silicon photomultiplier
Author :
Seul Ki Yang ; Hye-Young Lee ; Jin-A Jeon ; Sug-Whan Kim ; Jik Lee ; Park, Il H.
Author_Institution :
Yonsei Univ., Seoul, South Korea
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
Silicon photomultiplier (SiPM) is the next generation sensor that is available for single photon counting. We measured the photon detection efficiency (PDE) for the SiPM in the 400 to 800 nm range and over bias voltage up to 4V using photon counting method. The experimental setup consists of multi-wavelength LEDs, a monochromator, two 2-inch integrating spheres, a NIST calibrated reference photodiode and 1×1mm SiPM (1600 micro-pixel). We use the two integrating spheres system to measure PDE measurement. The advantage of this system that we can control light intensity to match dynamic range between the reference photodiode and the SiPM in low light condition. We also calculate precisely the irradiance on the SiPM through the ray-tracing simulation of the experimental setup. We present the results of the PDE measurement as well as the measurement technique.
Keywords :
calibration; elemental semiconductors; light emitting diodes; monochromators; photodetectors; photodiodes; photomultipliers; photon counting; ray tracing; silicon; NIST calibrated reference photodiode; PDE; Si; SiPM; integrating sphere; light intensity control; monochromator; multiwavelength LED; photon detection efficiency; precision measurement technique; ray-tracing simulation; sensor; silicon photomultiplier; single photon counting method; wavelength 400 nm to 800 nm; Detectors; NIST; Photodiodes; Photonics; Silicon; Voltage measurement; Wavelength measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829689