DocumentCode
687319
Title
Flash ADCs for multichannel integrated systems in submicron technology
Author
Otfinowski, P. ; Grybos, Pawel
Author_Institution
Dept. of Meas. & Electron., AGH Univ. of Sci. & Technol., Cracow, Poland
fYear
2013
fDate
Oct. 27 2013-Nov. 2 2013
Firstpage
1
Lastpage
4
Abstract
Multichannel readout systems for pixel or strip detectors often need a pulse amplitude measurement. For this purpose different kind of ADCs are used. For many applications the resolution of 4-6 bits is sufficient and the most important limitations are the circuit area, power consumption and fast signal processing. Such applications favor simplicity in choice of the architecture. This paper focuses solely on the flash ADCs with limited resolution, small area and conversion rates of few megasamples per second. The reduction of the converter´s area is beneficial in terms of speed and power consumption. However, it results in more pronounced mismatch effects, increased comparator threshold voltage variations and can lead to serious resolution degradation. The aim of this paper is to find the optimal solution for comparator offset voltage compensation in flash ADCs. This paper presents a comparison and a summary of the efficiency of different techniques, in terms of area, power consumption.
Keywords
analogue-digital conversion; comparators (circuits); compensation; readout electronics; comparator offset voltage compensation; comparator threshold voltage variation; flash ADC; multichannel integrated system; multichannel readout system; pixel detector; power consumption; pulse amplitude measurement; signal processing; strip detector; submicron technology; word length 4 bit to 6 bit; CMOS process; Conferences; Detectors; Layout; Power demand; Redundancy; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location
Seoul
Print_ISBN
978-1-4799-0533-1
Type
conf
DOI
10.1109/NSSMIC.2013.6829769
Filename
6829769
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