Title :
Flash ADCs for multichannel integrated systems in submicron technology
Author :
Otfinowski, P. ; Grybos, Pawel
Author_Institution :
Dept. of Meas. & Electron., AGH Univ. of Sci. & Technol., Cracow, Poland
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
Multichannel readout systems for pixel or strip detectors often need a pulse amplitude measurement. For this purpose different kind of ADCs are used. For many applications the resolution of 4-6 bits is sufficient and the most important limitations are the circuit area, power consumption and fast signal processing. Such applications favor simplicity in choice of the architecture. This paper focuses solely on the flash ADCs with limited resolution, small area and conversion rates of few megasamples per second. The reduction of the converter´s area is beneficial in terms of speed and power consumption. However, it results in more pronounced mismatch effects, increased comparator threshold voltage variations and can lead to serious resolution degradation. The aim of this paper is to find the optimal solution for comparator offset voltage compensation in flash ADCs. This paper presents a comparison and a summary of the efficiency of different techniques, in terms of area, power consumption.
Keywords :
analogue-digital conversion; comparators (circuits); compensation; readout electronics; comparator offset voltage compensation; comparator threshold voltage variation; flash ADC; multichannel integrated system; multichannel readout system; pixel detector; power consumption; pulse amplitude measurement; signal processing; strip detector; submicron technology; word length 4 bit to 6 bit; CMOS process; Conferences; Detectors; Layout; Power demand; Redundancy; Threshold voltage;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829769