Title :
Optimization of geometric configuration of detector system for non-destructive assay using nuclear resonance fluorescence
Author :
Negm, H. ; Omer, M. ; Heishun Zen ; Kii, T. ; Masuda, Kohji ; Hori, Toshikazu ; Ohgaki, H. ; Hajima, Ryoichi ; Kikuzawa, Nobuhiro ; Shizuma, Toshiyuki ; Hayakawa, Takeshi ; Daito, Izuru ; Toyokawa, Hiroyuki
Author_Institution :
Inst. of Adv. Energy, Kyoto Univ., Uji, Japan
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
The optimum geometric configuration of the detector system for non-destructive assay (NDA) of special nuclear material (SNM) by using nuclear resonance fluorescence (NRF) measurements has been studied. A Monte Carlo radiation transport code, GEANT4, has been developed to calculate NRF interaction, as well the simulation performed for detector array consist of seven LaBr3:Ce (1.5" × 3") detectors positioned at 5 cm from the center of the target by stepping angle 45°, to study the optimum scattering angle of NRF γ-rays with respect to the incoherent scattering and the self-absorption of target material. The 235U isotope used as target with different thicknesses at the resonant energy level 1733 keV. The calculation results addressed that, the measurements of NRF γ-rays at backward angles - relative to interrogating γ-beam is the optimum geometric configuration system of detectors.
Keywords :
Monte Carlo methods; gamma-ray detection; gamma-ray spectra; solid scintillation detectors; 235U isotope; GEANT4; LaBr3:Ce detectors; Monte Carlo radiation transport code; NDA; NRF gamma-rays; NRF interaction; SNM; backward angles; electron volt energy 1733 keV; geometric configuration optimization; incoherent scattering; interrogating gamma-beam; nondestructive assay; nuclear resonance fluorescence; optimum scattering angle; resonant energy level; special nuclear material; stepping angle; target material self-absorption; Detectors; Fluorescence; Gamma-rays; Laser beams; Materials; Photonics; Scattering;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829784