Title :
Measurement of charge division in pixelated CZT
Author :
Blevis, Ira ; Rubin, Daniel ; Livne, Amir ; Verbakel, Frank ; Zarchin, Oren
Author_Institution :
Philips Healthcare Global Res. & Adv. Dev., Haifa, Israel
fDate :
Oct. 27 2013-Nov. 2 2013
Abstract :
In medical X-ray imaging using semiconductor detectors, small pixels are employed to increase image resolution and count rate capability. However, the use of small pixels increases the occurrence of imaging signals that are split between neighboring pixels or even lost in the gap regions between pixels. To assess this problem monolithic pixelated CZT blocks were scanned from pixel to gap to pixel using a filtered X-ray beam and a narrow diameter collimator. A novel technique for recording and digitizing time series data from neighboring pixels for analysis offline was employed. Singles and coincidence spectra were compiled for each location and energy. The extent of charge splitting or charge loss was determined. The technique of digital summing of coincidence signals in neighboring pixels to recover split events is demonstrated.
Keywords :
X-ray spectra; biomedical equipment; cadmium compounds; coincidence techniques; collimators; data acquisition; data analysis; diagnostic radiography; filters; medical signal processing; semiconductor counters; time series; CZT pixelation; CdZnTe; X-ray beam filter; charge division measurement; charge loss extent determination; charge splitting extent determination; coincidence signal digital summing; coincidence spectra compilation; count rate capability; image resolution; imaging signal splitting; medical X-ray imaging; monolithic CZT blocks; narrow diameter collimator; neighboring pixels; offline analysis; pixel gap regions; pixel-gap pixel scanning; semiconductor detectors; small pixel usage; split event recovery; time series data digitizing; time series data recording; Collimators; Image quality; Lighting; Photonics; Time series analysis; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
DOI :
10.1109/NSSMIC.2013.6829820