Fluorescence X-ray computed tomography using CdTe detector array

This research involved a 3D simulation of a non-destructive test by detecting fluorescence X-ray with a position sensitive CdTe detector. Simulations proceeded in various conditions such as different types of phantoms. All simulations were based on fluorescence X-ray computed tomography (FXCT) by using the Monte Carlo method. In general, conventional Computed Tomography (CT) analyzes materials based on attenuation coefficients and is highly dependent on the densities of the material, hence, it can be difficult to discriminate similar density materials even if their atomic numbers differ. In this research, the material was exposed to an X-ray and the characteristic X-ray was measured using a 2D CdTe planar detector array to reconstruct the 3D image. Since atoms have their own characteristic X-ray energy, our system was even able to discriminate materials of the same density if the materials are composed of different atomic numbers.