DocumentCode :
687370
Title :
Zone refining and crystal growth of Bismuth tri-iodide crystals
Author :
Khan, Sharifullah ; Kima, H.J. ; Park, Heejung
Author_Institution :
Dept. of Phys., Kyungpook Nat. Univ., Daegu, South Korea
fYear :
2013
fDate :
Oct. 27 2013-Nov. 2 2013
Firstpage :
1
Lastpage :
3
Abstract :
Bismuth tri-iodide is a promising candidate for room temperature radiation detection because of its wide band gap energy. This material has higher effective atomic number as compared to germanium and CdZnTe. Its higher density results in improved stopping power for photons. But the presence of impurities limits the expected properties up to a large extent. Reduction of impurity concentration can lead to significant improvement in the properties like resistivity, charge transport and spectroscopic performance of detectors. In this study, zone refining technique has been employed to get detector grade refined material. ICP-MS technique was used to analyze the impurity concentration before and after zone refining. Bismuth tri-iodide single crystals were grown using Bridgman technique. Electrical contacts of Initial detectors are made using gold and silver paste. Detectors were tested by measuring their leakage current and resistivity.
Keywords :
bismuth compounds; crystal growth from melt; doping profiles; electrical resistivity; gold; leakage currents; mass spectroscopy; plasma materials processing; semiconductor growth; semiconductor-metal boundaries; silver; wide band gap semiconductors; zone refining; Ag-BiI3; Au-BiI3; Bridgman technique; ICP-MS technique; atomic number; charge transport; crystal growth; detector grade refined material; electrical contacts; gold paste; impurity concentration; leakage current; resistivity; room temperature radiation detection; silver paste; spectroscopic performance; wide band gap energy; zone refining; Bismuth; Conductivity; Crystals; Detectors; Impurities; Refining; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-0533-1
Type :
conf
DOI :
10.1109/NSSMIC.2013.6829824
Filename :
6829824
Link To Document :
بازگشت