• DocumentCode
    688573
  • Title

    Terahertz non-invasive sub-surface nano-scanner

  • Author

    Rahman, Aminur ; Rahman, A.K.

  • Author_Institution
    Appl. Res. & Photonics, Harrisburg, PA, USA
  • fYear
    2013
  • fDate
    9-14 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A terahertz sub-surface scanner is introduced that utilizes reflection mode non-contact interrogation of surfaces and interior layers of composite substrates with resolution of ~1 nm. Quantitative measurements are done by implementing a modified Beer-Lambert´s law.
  • Keywords
    composite materials; light reflection; nanophotonics; optical variables measurement; terahertz spectroscopy; terahertz waves; composite substrates; modified Beer-Lambert law; reflection mode; terahertz noninvasive subsurface nanoscanner; Nonlinear optics; Photonics; Reflection; Semiconductor device measurement; Spectroscopy; Substrates; Nonlinear optics: 190.3970 Microparticle nonlinear optics; Spectroscopy: 300.6470 Spectroscopy; Spectroscopy: 300.6495 Spectroscopy; semiconductors; terahertz;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2013 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6832947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=688573