DocumentCode :
68866
Title :
Advanced Forward Methods for Complex Wire Fault Modeling
Author :
Lundquist, E.J. ; Nagel, James R. ; Shang Wu ; Jones, B. ; Furse, Cynthia
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
Volume :
13
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
1172
Lastpage :
1179
Abstract :
This paper presents a novel implementation of forward modeling methods for simulating the reflectometry responses of faults in the shields of coaxial cable or other shielded lines. First, a cross-sectional modeling was used to determine the characteristic impedance of various wire sections. These values were then incorporated into longitudinal models to simulate the overall reflectometry response. The finite-difference method is a cross-sectional modeling method that was used to simulate cross-sectional characteristic impedance. Results obtained using this method are accurate within 1% of analytical solutions, and can be simulated very quickly using in-house codes. The finite-integral technique (FIT) is also used to model chafes on wires with TEM and higher order modes. Because FIT is computationally slow, a curve-fitting technique is used to predict the chafe profile within 0.01% of the simulated values. Modified transmission matrix and S-parameter methods are used to provide responses with accuracies within 0.3% of the measured profiles.
Keywords :
fault location; finite difference methods; reflectometry; shielding; wires (electric); TEM; advanced forward methods; characteristic impedance; coaxial cable shield; complex wire fault modeling; cross-sectional modeling; finite-difference method; finite-integral technique; reflectometry responses; shielded lines; Coaxial cables; Computational modeling; Frequency division multiplexing; Impedance; Time domain analysis; Transmission line matrix methods; Wires; Aerospace wiring; chafes; finite-difference method (FDM); finite-integral technique (FIT); modeling; modified transmission matrix (MTM); reflectometry; simulation; soft faults; wire faults;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2012.2227996
Filename :
6353881
Link To Document :
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